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Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
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Authors: Chakraborty, Purushottam (Saha Institute of Nuclear Physics) 
Book Description:
The precision analysis of surfaces and interfaces of condensed matter systems is an area of significant importance in materials science and fascinates the scientific community. One of the reasons is that a well-characterized surface is an excellent system to test ideas about the physics of two-dimensional systems in both traditional solids like metals and semiconductors and in liquids, polymers and other organic materials. As technological advances have been made, a wide range of techniques characterizes surface systems of inherent complexities that are markedly different from those of bulk systems. Since each technique has its own characteristics with particular advantages over the other, complimentary analytical tools are generally used for surface characterizations that are at least adequate for the purpose of the user.
With the rapid advancement in the techniques related to materials analysis, parallel developments in the ion beam methods have been made, generating a great deal of popularity for uses in analyzing surfaces and interfaces. In quantitative analyses, ion beams are accepted as a favored means owing to their extreme controllability. With the developments and diversification in ultra high vacuum and ion source instrumentation, complex ion optical designs have been realized simultaneously, eventually making ion beam methods a state-of-the-art means for probing surfaces and interfaces of condensed matter systems.

Table of Contents:
Preface; Chapter 1: Application of Low Energy Ion Scattering to Alloy Surfaces and Surface Alloys (D. J. O'Connor, University of Newcastle); Chapter 2: Direct Recoil and Ion Scattering Spectrometries as Probes of Liquid Surfaces (Michael Tassotto and Philip R. Watson, Oregon State University); Chapter 3: New Trends in Rutherford Backscattering Spectrometry (Émile J. Knystautas, Université Laval); Chapter 4: RBS and Channeling Analysis of Self-Assembled Structures (B. N. Dev, Institute of Physics, Sachivalaya Marg); Chapter 5: ERDA: A Tool for Surface and Near-Surface Studies (D.K.Avasthi, Nuclear Science Center, New Delhi; and Walter Assmann, Ludwig Maximilians University); Chapter 6: Light Emission from Sputtered Particles (Chin Shuang Lee, National Central University, Taiwan); Chapter 7: Dynamic Secondary Ion Mass Spectrometry for Compositional Analysis of Interfaces (Purushottam Chakraborty, Saha Institute of Nuclear Physics); Chapter 8: Surface Analysis with Slow, Highly Charged Ions like Au69+: TOF-SIMS and the Probing of Nano-Environments (Thomas Schenkel, Lawrence Berkeley National Laboratory); Chapter 9: Application of Low Energy Ions to Modify Multilayer Systems for Improved X-ray Reflectivity.(J. Verhoeven, FOM Institute for Atomic and Molecular Physics); Chapter 10: Bombardment-Induced Topography on Semiconductor Surfaces (Johan B Malherbe, University of Pretoria); Chapter 11: High Energy Ion Implantation in GaAs: Optical, Electrical and X-ray Investigations (Y.P. Ali, Hadharamout University; A.R. Damle, B.V. Polytechnic; Geeta P. Nair and A.M. Narsale, University of Mumbai; K.S. Chandrasekaran and B.M. Arora, Tata Institute of Fundamental Research); Index.

   Binding: Hardcover
   Pub. Date: 2002
   ISBN: 1-59033-538-4
  
  
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Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems