Nova Publishers
My Account Nova Publishers Shopping Cart
HomeBooksSeriesJournalsReference CollectionseBooksInformationSalesImprintsFor Authors
  Top » Catalog » Books » Physics » Solid State Physics » My Account  |  Cart Contents  |  Checkout   
Quick Find
Use keywords to find the product you are looking for.
Advanced Search
What's New? more
Constrained Bayesian Methods of Hypotheses Testing: A New Philosophy of Hypotheses Testing in Parallel and Sequential Experiments
Shopping Cart more
0 items
Shipping & Returns
Privacy Notice
Conditions of Use
Contact Us
01.Trends in Thin Solid Films Research
02.Condensed Matter Theories, Volume 18
03.Condensed Matter Theories, Volume 19
04.Introduction to Quantum Hall Effect
05.Quasicrystals: Types, Systems, and Techniques
06.Solid State Electronics Research Advances
07.Condensed Matter Theories, Volume 21
08.Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
09.Magnetic Properties of Solids
10.Progress in Ferromagnetism Research
Notifications more
NotificationsNotify me of updates to Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Tell A Friend
Tell someone you know about this product.
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
Retail Price: $130.00
10% Online Discount
You Pay:

Authors: Chakraborty, Purushottam (Saha Institute of Nuclear Physics) 
Book Description:
The precision analysis of surfaces and interfaces of condensed matter systems is an area of significant importance in materials science and fascinates the scientific community. One of the reasons is that a well-characterized surface is an excellent system to test ideas about the physics of two-dimensional systems in both traditional solids like metals and semiconductors and in liquids, polymers and other organic materials. As technological advances have been made, a wide range of techniques characterizes surface systems of inherent complexities that are markedly different from those of bulk systems. Since each technique has its own characteristics with particular advantages over the other, complimentary analytical tools are generally used for surface characterizations that are at least adequate for the purpose of the user.
With the rapid advancement in the techniques related to materials analysis, parallel developments in the ion beam methods have been made, generating a great deal of popularity for uses in analyzing surfaces and interfaces. In quantitative analyses, ion beams are accepted as a favored means owing to their extreme controllability. With the developments and diversification in ultra high vacuum and ion source instrumentation, complex ion optical designs have been realized simultaneously, eventually making ion beam methods a state-of-the-art means for probing surfaces and interfaces of condensed matter systems.

Table of Contents:
Preface; Chapter 1: Application of Low Energy Ion Scattering to Alloy Surfaces and Surface Alloys (D. J. O'Connor, University of Newcastle); Chapter 2: Direct Recoil and Ion Scattering Spectrometries as Probes of Liquid Surfaces (Michael Tassotto and Philip R. Watson, Oregon State University); Chapter 3: New Trends in Rutherford Backscattering Spectrometry (Émile J. Knystautas, Université Laval); Chapter 4: RBS and Channeling Analysis of Self-Assembled Structures (B. N. Dev, Institute of Physics, Sachivalaya Marg); Chapter 5: ERDA: A Tool for Surface and Near-Surface Studies (D.K.Avasthi, Nuclear Science Center, New Delhi; and Walter Assmann, Ludwig Maximilians University); Chapter 6: Light Emission from Sputtered Particles (Chin Shuang Lee, National Central University, Taiwan); Chapter 7: Dynamic Secondary Ion Mass Spectrometry for Compositional Analysis of Interfaces (Purushottam Chakraborty, Saha Institute of Nuclear Physics); Chapter 8: Surface Analysis with Slow, Highly Charged Ions like Au69+: TOF-SIMS and the Probing of Nano-Environments (Thomas Schenkel, Lawrence Berkeley National Laboratory); Chapter 9: Application of Low Energy Ions to Modify Multilayer Systems for Improved X-ray Reflectivity.(J. Verhoeven, FOM Institute for Atomic and Molecular Physics); Chapter 10: Bombardment-Induced Topography on Semiconductor Surfaces (Johan B Malherbe, University of Pretoria); Chapter 11: High Energy Ion Implantation in GaAs: Optical, Electrical and X-ray Investigations (Y.P. Ali, Hadharamout University; A.R. Damle, B.V. Polytechnic; Geeta P. Nair and A.M. Narsale, University of Mumbai; K.S. Chandrasekaran and B.M. Arora, Tata Institute of Fundamental Research); Index.

   Binding: Hardcover
   Pub. Date: 2002
   ISBN: 1-59033-538-4
Customers who bought this product also purchased
New Topics in Superconductivity Research
New Topics in Superconductivity Research
Special Focus Titles
01.Chaliapin and the Jews: The Question of Chaliapin's Purported Antisemitism
02.The Humanities: Past, Present and Future
03.The Poles: Myths and Reality
04.Child-Rearing: Practices, Attitudes and Cultural Differences
05."A Home Away from Home": A Community of International and South African University Students
06.Palliative Care: Oncology Experience from Hong Kong
07.The Enigma of Autism: Genius, Disorder or Just Different?
08.The Collector Mentality: Modernization of the Hunter-Gatherer
09.Face Processing: Systems, Disorders and Cultural Differences
10.Occurrences, Structure, Biosynthesis, and Health Benefits Based on Their Evidences of Medicinal Phytochemicals in Vegetables and Fruits. Volume 8
11.Crystal Growth: Concepts, Mechanisms and Applications
12.The Economic, Social and Political Impact of Mining on Akyem Abuakwa from the Pre-Colonial Era up to 1943

Nova Science Publishers
© Copyright 2004 - 2017

Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems