Table of Contents:
Preface; Chapter 1: Application of Low Energy Ion Scattering to Alloy Surfaces and Surface Alloys (D. J. O'Connor, University of Newcastle); Chapter 2: Direct Recoil and Ion Scattering Spectrometries as Probes of Liquid Surfaces (Michael Tassotto and Philip R. Watson, Oregon State University); Chapter 3: New Trends in Rutherford Backscattering Spectrometry (Émile J. Knystautas, Université Laval); Chapter 4: RBS and Channeling Analysis of Self-Assembled Structures (B. N. Dev, Institute of Physics, Sachivalaya Marg); Chapter 5: ERDA: A Tool for Surface and Near-Surface Studies (D.K.Avasthi, Nuclear Science Center, New Delhi; and Walter Assmann, Ludwig Maximilians University); Chapter 6: Light Emission from Sputtered Particles (Chin Shuang Lee, National Central University, Taiwan); Chapter 7: Dynamic Secondary Ion Mass Spectrometry for Compositional Analysis of Interfaces (Purushottam Chakraborty, Saha Institute of Nuclear Physics); Chapter 8: Surface Analysis with Slow, Highly Charged Ions like Au69+: TOF-SIMS and the Probing of Nano-Environments (Thomas Schenkel, Lawrence Berkeley National Laboratory); Chapter 9: Application of Low Energy Ions to Modify Multilayer Systems for Improved X-ray Reflectivity.(J. Verhoeven, FOM Institute for Atomic and Molecular Physics); Chapter 10: Bombardment-Induced Topography on Semiconductor Surfaces (Johan B Malherbe, University of Pretoria); Chapter 11: High Energy Ion Implantation in GaAs: Optical, Electrical and X-ray Investigations (Y.P. Ali, Hadharamout University; A.R. Damle, B.V. Polytechnic; Geeta P. Nair and A.M. Narsale, University of Mumbai; K.S. Chandrasekaran and B.M. Arora, Tata Institute of Fundamental Research); Index.